Harmonic voltage reflection analysis of UHF RFID chips

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dc.contributor.authorMuralter, Florian
dc.contributor.authorHani, Michael
dc.contributor.authorLandaluce, Hugo
dc.contributor.authorPerallos Ruiz, Asier
dc.contributor.authorBiebl, Erwin M.
dc.date.accessioned2025-10-30T09:36:49Z
dc.date.available2025-10-30T09:36:49Z
dc.date.issued2021
dc.date.updated2025-10-30T09:36:49Z
dc.description.abstractIn recent years, the exploitation of the nonlinear behavior of ultrahigh-frequency (UHF) radio frequency identification (RFID) chips has gained popularity. This article presents a measurement platform for the harmonic characterization of UHF RFID chips. The measurement of the incident and reflected wave at the RFID chip terminals is performed using a digital sampling oscilloscope (DSO). A novel signal-processing methodology is presented to extract time-domain reflection coefficient equivalents from a DSO measurement at the different load modulation states. Using a simultaneous measurement of the reflection coefficient with a vector network analyzer, the obtained measurement results were validated. Furthermore, a comparison to using real-time sampling and a power spectral density analysis is presented.en
dc.description.sponsorshipThis work was supported by the Basque Government through the Project IoTrain under Grant RTI2018-095499-B-C33en
dc.identifier.citationMuralter, F., Hani, M., Landaluce, H., Perallos, A., & Biebl, E. M. (2021). Harmonic voltage reflection analysis of UHF RFID chips. IEEE Transactions on Instrumentation and Measurement, 70. https://doi.org/10.1109/TIM.2020.3043942
dc.identifier.doi10.1109/TIM.2020.3043942
dc.identifier.eissn1557-9662
dc.identifier.issn0018-9456
dc.identifier.urihttps://hdl.handle.net/20.500.14454/4146
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.subject.otherNonlinear analysis
dc.subject.otherPower reflection
dc.subject.otherRadio frequency identification (RFID)
dc.titleHarmonic voltage reflection analysis of UHF RFID chipsen
dc.typejournal article
dcterms.accessRightsmetadata only access
oaire.citation.titleIEEE Transactions on Instrumentation and Measurement
oaire.citation.volume70
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