Muralter, FlorianHani, MichaelLandaluce, HugoPerallos Ruiz, AsierBiebl, Erwin M.2025-10-302025-10-302021Muralter, F., Hani, M., Landaluce, H., Perallos, A., & Biebl, E. M. (2021). Harmonic voltage reflection analysis of UHF RFID chips. IEEE Transactions on Instrumentation and Measurement, 70. https://doi.org/10.1109/TIM.2020.30439420018-945610.1109/TIM.2020.3043942https://hdl.handle.net/20.500.14454/4146In recent years, the exploitation of the nonlinear behavior of ultrahigh-frequency (UHF) radio frequency identification (RFID) chips has gained popularity. This article presents a measurement platform for the harmonic characterization of UHF RFID chips. The measurement of the incident and reflected wave at the RFID chip terminals is performed using a digital sampling oscilloscope (DSO). A novel signal-processing methodology is presented to extract time-domain reflection coefficient equivalents from a DSO measurement at the different load modulation states. Using a simultaneous measurement of the reflection coefficient with a vector network analyzer, the obtained measurement results were validated. Furthermore, a comparison to using real-time sampling and a power spectral density analysis is presented.engNonlinear analysisPower reflectionRadio frequency identification (RFID)journal article2025-10-301557-9662